Synchrotron X-ray investigation of tetracene thin films grown at different deposition fluxes

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 246, Issue 1, 2006, Pages 101-105

  Milita, S ^a   Servidori, M ^a   Cicoira, F ^b   Santato, C ^b   Pifferi, A ^a,c  

^a CNR   (Italy)

^b CNR   (Italy)

^c SINCROTRONE TRIESTE   (Italy)

Author keywords

Organic electronics; Organic thin films; Synchrotron X ray diffraction; Tetracene

Indexed keywords

POLYCRYSTALLINE MATERIALS; SILICON COMPOUNDS; SYNCHROTRON RADIATION; TETRODES; VACUUM; X RAY DIFFRACTION;

ORGANIC ELECTRONICS; ORGANIC THIN FILMS; SYNCHROTRON X-RAY DIFFRACTIONS; TETRACENE;

THIN FILMS;

EID: 33645861393     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.12.042     Document Type: Article

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