X-ray powder diffraction refinement of Ag2In2SiSe6 structure and phase diagram of the AgInSe2-SiSe2 system

Journal of Alloys and Compounds

Volumn 414, Issue 1-2, 2006, Pages 73-77

  Olekseyuk, I D ^a   Sachanyuk, V P ^a   Parasyuk, O V ^a  

^a LESYA UKRAINKA EASTERN EUROPEAN NATIONAL UNIVERSITY   (Ukraine)

Author keywords

Crystal structure; Semiconductors; X ray powder diffraction

Indexed keywords

CHEMICAL MODIFICATION; CRYSTAL STRUCTURE; PHASE DIAGRAMS; SEMICONDUCTOR MATERIALS; THERMOANALYSIS; X RAY DIFFRACTION ANALYSIS;

MONOCLINIC STRUCTURE; POLYMORPHOUS TRANSITION; POWDER X-RAY DIFFRACTION; QUATERNARY PHASE;

SILVER ALLOYS;

EID: 33645839833     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2005.07.025     Document Type: Article

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