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Volumn 46, Issue SUPPL.1, 2001, Pages
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Tomographic system based on plasma focus X-rays
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Author keywords
Defectoscopy; Image processing; Plasma focus applications; Tomographic reconstruction; X rays
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Indexed keywords
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EID: 33645819282
PISSN: 00295922
EISSN: 15085791
Source Type: Journal
DOI: None Document Type: Conference Paper |
Times cited : (13)
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References (2)
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