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Volumn 38, Issue 2, 2006, Pages 277-283

Alternate technique for simultaneous measurement of photoionization cross-section of isotopes by TOF mass spectrometer

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC BEAMS; ATOMS; EXCITED STATES; MASS SPECTROMETERS; PHOTOIONIZATION;

EID: 33645818751     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2006-00058-6     Document Type: Article
Times cited : (23)

References (44)
  • 6
    • 33645831906 scopus 로고
    • U.S. patent 4,149,077 (10 April)
    • M. Yamashita, H. Kashiwagi, U.S. patent 4,149,077 (10 April 1979)
    • (1979)
    • Yamashita, M.1    Kashiwagi, H.2
  • 9
    • 33645827698 scopus 로고
    • U.S. patent 4,320,300 (16 March)
    • R.P. Mariella, U.S. patent 4,320,300 (16 March 1982)
    • (1982)
    • Mariella, R.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.