Noise as a representation for reliability of light emitting diode

Wuli Xuebao/Acta Physica Sinica

Volumn 55, Issue 3, 2006, Pages 1384-1389

  Hu, Jin ^a   Du, Lei ^a   Zhuang, Yi Qi ^a   Bao, Jun Lin ^a   Zhou, Jiang ^a  

^a XIDIAN UNIVERSITY   (China)

Author keywords

1 f noise; LED; Light output power; Traps

Indexed keywords

EID: 33645760236     PISSN: 10003290     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)