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Volumn 21, Issue 2, 2006, Pages 711-718

Probabilistic assessment of equipment trips due to voltage sags

Author keywords

Curves; Power quality; Voltage sags; Voltage tolerance

Indexed keywords

ELECTRIC POTENTIAL; PROBABILITY; SENSITIVITY ANALYSIS;

EID: 33645730617     PISSN: 08858977     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPWRD.2005.855447     Document Type: Article
Times cited : (135)

References (21)
  • 4
    • 0025742536 scopus 로고
    • "Predicting and preventing problems associated with remote fault-clearing voltage dips"
    • Jan./Feb
    • L. Conrad, K. Little, and C. Grigg, "Predicting and preventing problems associated with remote fault-clearing voltage dips," IEEE Trans. Ind. Appl., vol. 27, no. 1, pp. 167-172, Jan./Feb. 1991.
    • (1991) IEEE Trans. Ind. Appl. , vol.27 , Issue.1 , pp. 167-172
    • Conrad, L.1    Little, K.2    Grigg, C.3
  • 5
    • 0031274889 scopus 로고    scopus 로고
    • "Voltage sag coordination for reliable plant operation"
    • Nov./Dec
    • L. E. Conrad and M. H. J. Bollen, "Voltage sag coordination for reliable plant operation," IEEE Trans. Ind. Appl., vol. 33, no. 6, pp. 1459-1463, Nov./Dec. 1997.
    • (1997) IEEE Trans. Ind. Appl. , vol.33 , Issue.6 , pp. 1459-1463
    • Conrad, L.E.1    Bollen, M.H.J.2
  • 8
    • 0004075758 scopus 로고    scopus 로고
    • "ITI (CBEMA) Curve and Application Note"
    • Information Technology Industry Council: [Online]. Available
    • Information Technology Industry Council: "ITI (CBEMA) Curve and Application Note" (2000). [Online]. Available: http://www.itic.org/ technical/iticurv.pdf
    • (2000)
  • 9
    • 33645739159 scopus 로고    scopus 로고
    • "SEMI F47-0200, Specification for semiconductor processing equipment voltage sag immunity"
    • [Online]. Available
    • Semiconductor Equipment and Materials International: "SEMI F47-0200, Specification for semiconductor processing equipment voltage sag immunity" (2000). [Online]. Available: http://www.semi.org/pubs/ semipubs.nsf
    • (2000) Semiconductor Equipment and Materials International
  • 10
    • 12544253378 scopus 로고    scopus 로고
    • "Sensitivity of personal computers to voltage sags, short interruptions"
    • Jan
    • S. Z. Djokic, J. Desmet, G. Vanalme, J. V. Milanović, and K. Stockman, "Sensitivity of personal computers to voltage sags, short interruptions," IEEE Trans. Power Del., vol. 20, no. 1, pp. 375-383, Jan. 2005.
    • (2005) IEEE Trans. Power Del. , vol.20 , Issue.1 , pp. 375-383
    • Djokic, S.Z.1    Desmet, J.2    Vanalme, G.3    Milanović, J.V.4    Stockman, K.5
  • 11
    • 33645739302 scopus 로고    scopus 로고
    • "Voltage sag effects on continuous industrial processes: Desensitizing study for textile manufacture"
    • Atlanta, GA
    • R. Caldon, M. Fauri, and L. Fellin, "Voltage sag effects on continuous industrial processes: Desensitizing study for textile manufacture," in Proc. 2nd Int. Conf. Power Quality: End-Use Applications Perspectives, vol. D-13, Atlanta, GA, pp. 1-6.
    • Proc. 2nd Int. Conf. Power Quality: End-Use Applications Perspectives , vol.D-13 , pp. 1-6
    • Caldon, R.1    Fauri, M.2    Fellin, L.3
  • 12
    • 12744262679 scopus 로고    scopus 로고
    • "Sensitivity of AC adjustable speed drives to voltage sags, short interruptions and under-voltage transients"
    • Jan
    • S. Z. Djokic, K. Stockman, J. V. Milanović, J. J. M. Desmet, and R. Belmans, "Sensitivity of AC adjustable speed drives to voltage sags, short interruptions and under-voltage transients," IEEE Trans. Power Del., vol. 20, no. 1, pp. 494-505, Jan. 2005.
    • (2005) IEEE Trans. Power Del. , vol.20 , Issue.1 , pp. 494-505
    • Djokic, S.Z.1    Stockman, K.2    Milanović, J.V.3    Desmet, J.J.M.4    Belmans, R.5
  • 13
    • 33645731366 scopus 로고    scopus 로고
    • EPRI Report No. 46. (1998, Oct.) Performance of a hold-in device for relays, contactors and motor-starters. [Online]. Available
    • EPRI Brief Report No. 46. (1998, Oct.) Performance of a hold-in device for relays, contactors and motor-starters. [Online]. Available: http:// www.portlandgeneral.com/business/products/businesspower-problems/ powerqualityschool/brief46.pdf.
  • 15
    • 3242806008 scopus 로고    scopus 로고
    • "Sensitivity of AC coil contactors to voltage sags, short interruptions and under-voltage transients"
    • Jul
    • S. Z. Djokic, J. V. Milanović, and D. S. Kirschen, "Sensitivity of AC coil contactors to voltage sags, short interruptions and under-voltage transients," IEEE Trans. Power Del., vol. 19, no. 3, pp. 1299-1307, Jul. 2004.
    • (2004) IEEE Trans. Power Del. , vol.19 , Issue.3 , pp. 1299-1307
    • Djokic, S.Z.1    Milanović, J.V.2    Kirschen, D.S.3
  • 16
    • 18844395969 scopus 로고    scopus 로고
    • "A probabilistic method for comprehensive voltage sag management in power distribution systems"
    • Ph.D. dissertation, Dept. Elect. Commun. Eng., Helsinki Univ. Technol., Espoo, Finland
    • P Pohjanheimo, "A probabilistic method for comprehensive voltage sag management in power distribution systems," Ph.D. dissertation, Dept. Elect. Commun. Eng., Helsinki Univ. Technol., Espoo, Finland, 2003.
    • (2003)
    • Pohjanheimo, P.1
  • 17
    • 33645745795 scopus 로고    scopus 로고
    • "Generalized methodology for the assessment of voltage sag performance indices and equipment sensitivity"
    • Ph.D. dissertation, Dept. Elect. Eng. Electron., Univ. Manchester Inst. Technol., Manchester, U.K
    • S. Z. Djokic, "Generalized methodology for the assessment of voltage sag performance indices and equipment sensitivity," Ph.D. dissertation, Dept. Elect. Eng. Electron., Univ. Manchester Inst. Technol., Manchester, U.K., 2004.
    • (2004)
    • Djokic, S.Z.1
  • 20
    • 12544254484 scopus 로고    scopus 로고
    • "The influence of modeling of fault distribution for stochastic prediction of voltage sags"
    • Jan
    • J. V. Milanović, M. T. Aung, and C. P. Gupta, "The influence of modeling of fault distribution for stochastic prediction of voltage sags," IEEE Trans. Power Del., vol. 20, no. 1, pp. 278-285, Jan. 2005.
    • (2005) IEEE Trans. Power Del. , vol.20 , Issue.1 , pp. 278-285
    • Milanović, J.V.1    Aung, M.T.2    Gupta, C.P.3
  • 21
    • 12544254426 scopus 로고    scopus 로고
    • "The method of fault positions for stochastic prediction of voltage sags: A case study"
    • Naples, Italy, Sep
    • G. Olguin and M. H. J. Bollen, "The method of fault positions for stochastic prediction of voltage sags: A case study," in Proc. Int. Conf. Probabilistic Methods Applied to Power Systems, Naples, Italy, Sep. 2002, pp. 22-26.
    • (2002) Proc. Int. Conf. Probabilistic Methods Applied to Power Systems , pp. 22-26
    • Olguin, G.1    Bollen, M.H.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.