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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 4 A, 2006, Pages 2736-2742

Length dependence of tunneling current through single phenylene oligomers measured by scanning tunneling microscopy at low temperature

(4) Wakamatsu, Satoshi a Fujii, Shintaro a Akiba, Uichi a Fujihira, Masamichi a

a TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

Decay constant; Phenylene oligomer; Scanning tunneling microscope; Self assembled monolayer; Single molecule; Single molecular conductance

Indexed keywords

CRYOGENICS; ELECTRON TUNNELING; MONOLAYERS; OLIGOMERS; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY;

DECAY CONSTANT; PHENYLENE OLIGOMER; SELF-ASSEMBLED MONOLAYER; SINGLE MOLECULE; SINGLE-MOLECULAR CONDUCTANCE;

ELECTRIC CURRENTS;

EID: 33645713760 PISSN: 00214922 EISSN: 13474065 Source Type: Journal
DOI: 10.1143/JJAP.45.2736 Document Type: Article

Times cited : (10)

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