SCOPUS 정보 검색 플랫폼

Volumn 99, Issue 6, 2006, Pages

Ion debris characterization from a z-pinch extreme ultraviolet light source

Author keywords

[No Author keywords available]

Indexed keywords

EXTREME ULTRAVIOLET (EUV) LIGHT SOURCES; ION DEBRIS CHARACTERIZATION; ION TIME-OF-FLIGHT (ITOF) ANALYSIS; PHOTON COLLECTION;

LIGHT EMISSION; MULTILAYERS; PARTICULATE EMISSIONS; PHOTONS; SCANNING ELECTRON MICROSCOPY; ULTRAVIOLET RADIATION; XENON;

LIGHT SOURCES;

EID: 33645696841 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2175471 Document Type: Article

Times cited : (27)

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