A new computational technique for processing transmission-line measurements to determine dispersive dielectric properties

Geophysics

Volumn 71, Issue 2, 2006, Pages

  Oswald, Benedikt ^a   Doetsch, Joseph ^b   Roth, Kurt ^b  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

Clay; Frequency domain analysis; Genetic algorithms; Geophysical techniques; Ground penetrating radar; Permittivity; Terrestrial electricity; Time domain reflectometry; Transmission lines

Indexed keywords

DIELECTRIC PROPERTY;

EID: 33645689453     PISSN: 00168033     EISSN: None     Source Type: Journal    
DOI: 10.1190/1.2187764     Document Type: Article

References (34)

1. Berberian, J. G., 1993, Time domain reflectometry: Bilinear corrections and extending the range of analysis beyond the quarter and half wavelength conditions: Journal of Molecular Liquids, 56, 1-18.
2. Berberian, J. G., and E. King, 2002, An overview of time domain spectroscopy: Journal of Non-Crystalline Solids, 305, 10-18.
3. Böttcher, C. J. F., 1973a, Theory of electric polarization, vol. I: Dielectrics in static fields: Elsevier Scientific Publishing Company.
4. Böttcher, C. J. F., 1973b, Theory of electric polarization, vol. 2: Dielectrics in time-dependent fields: Elsevier Scientific Publishing Company.
5. Cole, K. S., and R. H. Cole, 1941, Dispersion and absorption in dielectrics: I - Alternating current characteristics: Journal of Chemical Physics, 9, 341-351.
6. Cole, K. S., and R. H. Cole, 1942, Dispersion and absorption in dielectrics: II - Direct current characteristics: Journal of Chemical Physics, 10, 98-105.
7. Cole, R. H., 1975a, Evaluation of dielectric behavior by time domain spectroscopy: 1 - Dielectric response by real time analysis: Journal of Physical Chemistry, 79, 1459-1468.
8. Cole, R. H., 1975b, Evaluation of dielectric behavior by time domain spectroscopy: 2 - Complex permittivity: Journal of Physical Chemistry, 79, 1469-1474.
9. Cole, R. H., S. Mashimo, and P. I. Winsor, 1980, Evaluation of dielectric behavior by time domain spectroscopy: 3 - Precision difference methods: Journal of Physical Chemistry, 84, 786-793.
10. Debye, P., 1929, Polare molekeln: Verlag von S. Hirzel.
11. ENRESA, 1998, FEBEX bentonite: Origin, properties and fabrication of blocks: Technical Publication 05/98, Empresa Nacional de Residuos Radiactivos S.A. (ENRESA).
12. Feldman, Y., A. Andrianov, E. Polygalov, I. Ermolina, G. Romanychev, Y. Zuev, and B. Milgotin, 1996, Time domain dielectric spectroscopy: An advanced measuring system: Review of Scientific Instruments, 67, 3208-3216. RSINAK 0034-6748
13. Feldman, Y. D., Y. F. Zuev, E. A. Polygalov, and V. D. Fedotov, 1992, Time domain dielectric spectroscopy: A new effective tool for physical chemistry investigation: Colloid & Polymer Science, 270, 768-780.
14. Fellner-Feldegg, H., 1969, The measurement of dielectrics in the time domain: Journal of Physical Chemistry, 73, 616-623.
15. García-Gutíerrez, M., T. Missana, M. Mingarro, J. Samper, Z. Dai, and J. Molinero, 2001, Solute transport properties of compacted ca-bentonite used in FEBEX project: Journal of Contaminant Hydrology, 47, 127-137.
16. Havriliak, S., and S. Negami, 1966, A complex plane analysis of α-dispersion in some polymer systems: Journal of Polymer Science, 14, 99-117.
17. Havriliak, S., and S. Negami, 1967, A complex plane representation of dielectric and mechanical relaxation processes in some polymers: Polymer, 8, doi: 10.1016/0032-3861(67) 90021-3.
18. Hewlett-Packard, 1985, Measuring dielectric constant with the HP 8510 network analyzer: The measurement of both permittivity and permeability of solid materials: HP product note 8510-3.
19. Hewlett-Packard, 1992, Basics of measuring the dielectric properties of materials: HP application note 1217-1.
20. Hilhorst, M. A., C. Dirksen, F. W. H. Kampers, and R. A. Feddes, 2001, Dielectric relaxation of bound water versus soil matric pressure: Soil Science Society of America Journal, 65, 311-314.
21. Hoekstra, P., and A. Delaney, 1974, Dielectric properties of soils at UHF and microwave frequencies: Journal of Geophysical Research, 79, 1699-1708. JGREA2 0148-0227
22. Huisman, J. A., W. Bouten, and J. A. Vrugt, 2004, Accuracy of frequency domain analysis scenarios for the determination of complex dielectric permittivity: Water Resources Research, 40, no. 2, 1-12.
23. Huisman, J. A., A. H. Weerts, T. J. Heimovaara, and W. Bouten, 2002, Comparison of travel time analysis and inverse modeling for soil water content determination with time domain reflectometry: Water Resources Research, 38, no. 6, doi:. 10.1029/2001/WR000259
24. Ishida, T., T. Makino, and C. Wang, 2000, Dielectric-relaxation spectroscopy of kaolinite, montmorillonite, allophane, and imogolite under moist conditions: Clays and Clay Minerals, 48, no. 1, 75-84. CLCMAB 0009-8604
25. Jonscher, A. K., 1983, Dielectric relaxation in solids: Chelsea Dielectrics Press.
26. Kittel, C., 1976, Introduction to solid state physics, 5th ed.: John Wiley & Sons, Inc.
27. Levine, D., 1966, Users guide to the PGAPack parallel genetic algorithm library: Argonne National Laboratory Technical Report 95/18.
28. Nyfors, E., and P. Vainikainen, 1989, Industrial microwave sensors: Artech House, Inc.
29. Oswald, B., 2000, Full wave solution of inverse electromagnetic problems - Applications in environmental measurement techniques: PhD dissertation, Swiss Federal Institute of Technology.
30. Rahmat-Samii, Y., and E. Michielssen, 1999, Electromagnetic optimization by genetic algorithms: John Wiley & Sons, Inc.
31. Ramo, S., J. R. Whinnery, and T. V. Duzer, 1984, Fields and waves in communication electronics, 2nd ed.: John Wiley & Sons, Inc.
32. Scaife, B., 1989, Principles of dielectrics: Monographs on the physics and chemistry of materials: Oxford University Press.
33. Schäfer, H., E. Sternin, R. Stannarius, M. Arndt, and F. Kremer, 1996, Novel approach to the analysis of broadband dielectric spectra: Physical Review Letters, 76, 2177-2180. PRLTAO 0031-9007
34. Zorn, R., 2002, Logarithmic moments of relaxation time distribution: Journal of Chemical Physics, 116, 3204-3209. JCPSA6 0021-9606