A two-factor error model for quantitative steganalysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6072, Issue , 2006, Pages

  Böhme, Rainer ^a   Ker, Andrew D ^b  

^a DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Benchmarking; LSB steganography; Regression analysis; Steganalysis; Steganalytic security metrics

Indexed keywords

BENCHMARKING; DETECTORS; MATHEMATICAL MODELS; PROBLEM SOLVING; REGRESSION ANALYSIS; SECURITY SYSTEMS;

LSB STEGANOGRAPHY; STEGANALYSIS; STEGANALYTIC SECURITY METRICS;

ERROR ANALYSIS;

EID: 33645678198     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.643701     Document Type: Conference Paper

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