Comment on 'Bi nanolines on Si(001): Registry with substrate'

Nanotechnology

Volumn 17, Issue 6, 2006, Pages 1801-1802

  Bowler, D R ^a   Owen, J H G ^b   Miki, K ^b  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH; DIMERS; NANOTECHNOLOGY; SILICON; SUBSTRATES; X RAY ANALYSIS;

BI NANOLINES; FOUR-DIMER-WIDE HAIKU MODEL; THREE-DIMER-WIDE MIKI MODEL; X-RAY DATA;

NANOSTRUCTURED MATERIALS;

EID: 33645662530     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/6/N01     Document Type: Review

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