Twin and scratch detection and removal in micrograph images of inconel™718

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6070, Issue , 2006, Pages

  Jakob, Gerhard ^a   Rinnhofer, Alfred ^a   Bischof, Horst ^b   Benesova, Wanda ^a  

^a JOANNEUM RESEARCH   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Grain size; Grayscale image reconstruction; Hough transform; Intercept length; Scratch detection; Superalloy; Twin boundary; Watershed segmentation

Indexed keywords

ARTIFICIAL INTELLIGENCE; GRAIN SIZE AND SHAPE; IMAGE PROCESSING; NICKEL ALLOYS; SUPERALLOYS; WATERSHEDS;

GRAYSCALE IMAGE RECONSTRUCTION; HOUGH TRANSFORM; SCRATCH DETECTION; TWIN BOUNDARY; WATERSHED SEGMENTATION;

OBJECT RECOGNITION;

EID: 33645659670     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.642635     Document Type: Conference Paper

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