PVDF and PZT piezoelectric wafer active sensors for structural health monitoring

American Society of Mechanical Engineers, Nondestructive Evaluation Engineering Division (Publication) NDE

Volumn 26 NDE, Issue , 2005, Pages 69-76

  Lin, Bin ^a,b   Giurgiutiu, Victor ^a,b  

^a ASME   (United States)

^b University of South Carolina   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMECHANICAL IMPEDANCE; STRUCTURAL HEALTH MONITORING (SHM); TRANSDUCTION;

ELASTICITY; ELECTRIC IMPEDANCE; ELECTRIC PROPERTIES; NONDESTRUCTIVE EXAMINATION; SENSORS;

STRUCTURAL ANALYSIS;

EID: 33645658653     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2005-80400     Document Type: Conference Paper

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