Capacitive measurements for a novel ECIS (electrolyte-carbon nanotubes-insulator-semiconductor) structure

Semiconductor Science and Technology

Volumn 21, Issue 5, 2006, Pages 686-690

  Lin, Qing ^a   Cheon, Jun Ho ^a   Gong, Byoung Don ^a   Park, Young June ^a   Min, Hong Shick ^a   Kang, Dong Won ^a   Kim, Lily ^a   Suh, Jung Sang ^a  

^a Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING; CARBON NANOTUBES; CMOS INTEGRATED CIRCUITS; FIELD EFFECT SEMICONDUCTOR DEVICES; MICROPROCESSOR CHIPS;

CMOS CHIPS; ELECTROLYTE-CARBON NANOTUBES-INSULATOR-SEMICONDUCTOR; MULTI-WALLED CARBON NANOTUBE; POTENTIAL-METRIC SENSORS;

CAPACITORS;

EID: 33645657294     PISSN: 02681242     EISSN: 13616641     Source Type: Journal    
DOI: 10.1088/0268-1242/21/5/021     Document Type: Article

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