Structure of Zn-Se-Te system with submonolayer insertion of ZnTe grown by migration enhanced epitaxy

Journal of Applied Physics

Volumn 99, Issue 6, 2006, Pages

  Gong, Y ^a   Yan, Hanfei F ^a   Kuskovsky, I L ^b   Gu, Y ^a   Noyan, I C ^a   Neumark, G F ^a   Tamargo, M C ^c  

^a Columbia University ^*  (United States)

^b CITY UNIVERSITY OF NEW YORK   (United States)

^c CITY COLLEGE OF NEW YORK   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

REFLECTION MEASUREMENTS; STRUCTURAL PARAMETERS; SUBMONOLAYER THICKNESS; X-RAY REFLECTIVITY (XRR);

ABSORPTION; DIFFUSION; MOLECULAR BEAM EPITAXY; MONOLAYERS; OPTICAL PROPERTIES; OPTICAL RESOLVING POWER; X RAY DIFFRACTION; ZINC COMPOUNDS;

TERNARY SYSTEMS;

EID: 33645654268     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2184434     Document Type: Article

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