Application and reliability of change-point analyses for detecting a defective stage in integrated circuit manufacturing

Communications in Statistics: Simulation and Computation

Volumn 35, Issue 2, 2006, Pages 479-496

  Besse, P ^a   Le Gall, C ^b  

^a INSTITUT DE MATHÉMATIQUES DE TOULOUSE   (France)

^b Freescale Semiconductors   (France)

Author keywords

Bagging; Change point analysis; Markov Chain Monte Carlo; Optimal segmentation; Quality control

Indexed keywords

EID: 33645645543     PISSN: 03610918     EISSN: 15324141     Source Type: Journal    
DOI: 10.1080/03610910600591602     Document Type: Article

References (12)