Proton-Induced SEU, Dose Effects, and LEO Performance Predictions for R3000 Microprocessors

IEEE Transactions on Nuclear Science

Volumn 39, Issue 6, 1992, Pages 2309-2315

  Shaeffer, D L ^a   Kimbrough, J R ^a   Wilburn, J W ^a   Denton, S M ^a   Kaschmitter, J L ^a   Colella, N J ^a   Coakley, P G ^b   Casteneda, C ^c  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b TITAN CORPORATION   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645583797     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.211441     Document Type: Article

References (25)

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