Influence of processing and conduction materials on properties of co-fired resistors in LTCC structures

Journal of the European Ceramic Society

Volumn 26, Issue 10-11, 2006, Pages 1937-1941

  Birol, Hansu ^a   Maeder, T ^a   Ryser, P ^a  

^a EPFL   (Switzerland)

Author keywords

Electrical properties; Electron microscopy; LTCC; Microstructure final; Sintering

Indexed keywords

CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; FIRING (OF MATERIALS); RESISTORS; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY DIFFRACTION ANALYSIS;

CERAMIC TAPES; CO-FIRED RESISTORS; LOW TEMPERATURE CO-FIRED CERAMICS (LTCC);

CERAMIC PRODUCTS;

CERAMIC PRODUCTS; CRYSTAL MICROSTRUCTURE; ELECTRIC PROPERTIES; ENERGY DISPERSIVE SPECTROSCOPY; FIRING (OF MATERIALS); RESISTORS; SCANNING ELECTRON MICROSCOPY; SINTERING; X RAY DIFFRACTION ANALYSIS;

EID: 33645551060     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.09.030     Document Type: Conference Paper

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