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Volumn 19, Issue 5, 2006, Pages
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Demonstration of a 120 GHz single-flux-quantum shift register circuit based on a 10 kA cm-2 Nb process
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Author keywords
[No Author keywords available]
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Indexed keywords
INTEGRATED CIRCUIT TESTING;
NIOBIUM;
PRODUCT DESIGN;
QUANTUM THEORY;
TIMING CIRCUITS;
TIMING DEVICES;
HIGH-FREQUENCY CLOCK GENERATOR;
MCCUMBER PARAMETERS;
ON-CHIP TESTS;
SINGLE-FLUX-QUANTUM (SFQ) EIGHT-BIT SHIFT REGISTER;
SHIFT REGISTERS;
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EID: 33645546397
PISSN: 09532048
EISSN: 13616668
Source Type: Journal
DOI: 10.1088/0953-2048/19/5/S33 Document Type: Article |
Times cited : (37)
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References (11)
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