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Volumn 26, Issue 10-11, 2006, Pages 1817-1820

Novel evaluation method for complex high permittivity of BaTiO3 families at microwave frequency

Author keywords

BaTiO3 and titanates; Dielectric properties; Microwave property; Spectroscopy

Indexed keywords

COMPUTER SIMULATION; DIELECTRIC PROPERTIES; MICROWAVES; PERMITTIVITY; SPECTROSCOPY;

EID: 33645545601     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.09.006     Document Type: Conference Paper
Times cited : (3)

References (6)
  • 2
    • 84928809109 scopus 로고
    • A dielectric resonator method of measuring inductive capacitance in the millimeter range
    • B.W. Hakki P.D. Coleman A dielectric resonator method of measuring inductive capacitance in the millimeter range IRE Trans. on MTT, MTT-8 1960 402-410
    • (1960) IRE Trans. on MTT, MTT-8 , pp. 402-410
    • Hakki, B.W.1    Coleman, P.D.2
  • 3
    • 33645548512 scopus 로고    scopus 로고
    • Measurement method of complex relative permittivity for dielectric resonator material at microwave frequency
    • Y. Kobayashi Measurement method of complex relative permittivity for dielectric resonator material at microwave frequency IEC 61338-1-3 1999
    • (1999) IEC 61338-1-3
    • Kobayashi, Y.1
  • 5
    • 10444257921 scopus 로고    scopus 로고
    • Novel evaluation method of the complex dielectric constant of high-permittivity material at microwave frequency
    • K. Wakino S. Kumagai T. Shiraishi T. Kitazawa T. Fujii A. Ando Novel evaluation method of the complex dielectric constant of high-permittivity material at microwave frequency Jpn. J. Appl. Phys. 43 9B 2004 6755-6758
    • (2004) Jpn. J. Appl. Phys. , vol.43 , Issue.9 B , pp. 6755-6758
    • Wakino, K.1    Kumagai, S.2    Shiraishi, T.3    Kitazawa, T.4    Fujii, T.5    Ando, A.6
  • 6
    • 0026852512 scopus 로고
    • New results for coaxial re-entrant cavity with partially dielectric filled gap
    • W. Xi W.R. Tinga W.A.G. Voss B.Q. Tian New results for coaxial re-entrant cavity with partially dielectric filled gap IEEE Trans. Microwave Theory Tech. 40 4 1992 747-753
    • (1992) IEEE Trans. Microwave Theory Tech. , vol.40 , Issue.4 , pp. 747-753
    • Xi, W.1    Tinga, W.R.2    Voss, W.A.G.3    Tian, B.Q.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.