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Volumn 26, Issue 10-11, 2006, Pages 1857-1860
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Characterization of dielectric properties of oxide materials in frequency range from GHz to THz
a a a |
Author keywords
Dielectric properties; THz TDS; ZnO
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Indexed keywords
CHARACTERIZATION;
DIELECTRIC RELAXATION;
ELECTRIC CONDUCTIVITY;
FERROMAGNETIC MATERIALS;
OXIDES;
PERMITTIVITY;
PIEZOELECTRIC MATERIALS;
SINGLE CRYSTALS;
SPECTROSCOPY;
OXIDE MATERIALS;
TIME DOMAIN SPECTROSCOPY;
DIELECTRIC PROPERTIES;
CHARACTERIZATION;
DIELECTRIC PROPERTIES;
DIELECTRIC RELAXATION;
ELECTRIC CONDUCTIVITY;
FERROMAGNETIC MATERIALS;
OXIDES;
PERMITTIVITY;
PIEZOELECTRIC MATERIALS;
SINGLE CRYSTALS;
SPECTROSCOPY;
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EID: 33645542741
PISSN: 09552219
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jeurceramsoc.2005.09.094 Document Type: Conference Paper |
Times cited : (48)
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References (8)
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