Microstructure - Electrical properties relationship of YSZ thin films reactively sputter-deposited at different pressures

Ionics

Volumn 11, Issue 3-4, 2005, Pages 301-305

  Briois, P ^a   Gourba, E ^b   Billard, A ^a   Ringuede A ^b   Cassir, M ^b  

^a INSTITUT JEAN LAMOUR   (France)

^b ECOLE NORMALE SUPÉRIEURE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645526458     PISSN: 09477047     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02430393     Document Type: Article

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