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Volumn 24, Issue 2, 2006, Pages 945-949

Electrical and emission properties of nanocomposite SiOx(Si) and SiO2(Si) films

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; ELECTRON TUNNELING; NANOSTRUCTURED MATERIALS; SILICATES; THERMAL EFFECTS;

EID: 33645520118     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2183787     Document Type: Article
Times cited : (9)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.