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Volumn 24, Issue 2, 2006, Pages 945-949
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Electrical and emission properties of nanocomposite SiOx(Si) and SiO2(Si) films
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC PROPERTIES;
ELECTRON TUNNELING;
NANOSTRUCTURED MATERIALS;
SILICATES;
THERMAL EFFECTS;
EMISSION PROPERTIES;
SILICON POWDER;
THERMAL ANNEALING;
THERMAL EVAPORATION;
THIN FILMS;
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EID: 33645520118
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.2183787 Document Type: Article |
Times cited : (9)
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References (16)
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