Abelès method revisited

Applied Optics

Volumn 45, Issue 6, 2006, Pages 1120-1123

  Logofǎtu, Petre C ^a   Apostol, Dan ^a   Damian, Victor ^a   Iordache, Luliana M ^a   Bojan, Mihaela M ^a   Müller, Raluca ^b  

^a NATIONAL INSTITUTE FOR LASER   (Romania)

^b NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT IN MICROTECHNOLOGIES   (Romania)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; NUMERICAL METHODS; REFRACTIVE INDEX;

ABELÈS METHOD; CLASSICAL METHODS; CLOSED-FORM EQUATIONS; METHOD IS AMBIGUOUS;

THIN FILMS;

EID: 33645517524     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.001120     Document Type: Article

References (5)

1. F. Abelès, "Methods for determining optical parameters of thin films," in Progress in Optics, E. Wolf, ed. (North Holland, 1963), Vol. 2, pp. 249-288.
2. J. E. Goell and R. D. Standley, "Effect of refractive index gradients on index measurements by the Abelès method," Appl. Opt. 11, 2502-2505 (1972).
3. I. Awai and J. Ikenoue, "Effect of film transition layers on the Abelès method," Appl. Opt. 23, 1890-1896 (1984).
4. V. Damian, P. C. Logofǎtu, D. Apostol, F. Garoi, I. Iordache, A. Timcu, O. Ligor, and R. Müller, "Polymer thin film refractive index determination," in Proceedings of IEEE 2004 International Semiconductor Conference (IEEE, 2004), pp. 441-444.
5. M. V. Klein and T. E. Furtak, Optics (Wiley, 1986).