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Volumn 88, Issue 13, 2006, Pages

Angular dependence of silicon oxide etching yield in fluorocarbon chemistries

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ETCHING; FLUOROCARBON PLASMA; ION IMPINGING ANGLE; PROFILE EVOLUTION MODELING;

EID: 33645516026     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2190465     Document Type: Article
Times cited : (4)

References (23)
  • 21
    • 33645506036 scopus 로고    scopus 로고
    • Ph.D. thesis, Massachusetts Institute of Technology
    • Heeyeop Chae, Ph.D. thesis, Massachusetts Institute of Technology, 2000.
    • (2000)
    • Heeyeop, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.