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Volumn 88, Issue 13, 2006, Pages
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Angular dependence of silicon oxide etching yield in fluorocarbon chemistries
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL ETCHING;
FLUOROCARBON PLASMA;
ION IMPINGING ANGLE;
PROFILE EVOLUTION MODELING;
COMPUTER SIMULATION;
DEPOSITION;
FLUOROCARBONS;
INDUCTIVELY COUPLED PLASMA;
SILICA;
SPUTTERING;
ETCHING;
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EID: 33645516026
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2190465 Document Type: Article |
Times cited : (4)
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References (23)
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