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Volumn 99, Issue 3, 2006, Pages

Characterization of radio frequency plasma using Langmuir probe and optical emission spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; EMISSION SPECTROSCOPY; LIGHT EMISSION; NATURAL FREQUENCIES; TEMPERATURE MEASUREMENT;

EID: 33645514823     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2171777     Document Type: Article
Times cited : (29)

References (16)
  • 7
    • 0000781578 scopus 로고
    • M. C. M. Van de Sanden, J. M. de Regt, G. M. Janssen, J. A. M. Van der Mullen, D. C. Schram, and B. Van der Sijde, Rev. Sci. Instrum. 63, 3369 (1992).
    • (1992) Rev. Sci. Instrum. , vol.63 , pp. 3369
    • Van De Sanden, M.C.M.1
  • 12
    • 0000001546 scopus 로고    scopus 로고
    • J. M. Hendron, C. M. O. Mahony, T. Morrow, and W. G. Graham, J. Appl. Phys. 81, 2131 (1997).
    • (1997) J. Appl. Phys. , vol.81 , pp. 2131
    • Hendron, J.M.1
  • 14
    • 33645510700 scopus 로고    scopus 로고
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File Card No. 6-416 (ASTM, Philadelphia, PA, 1967)
    • Joint Committee on Powder Diffraction Standards, Powder Diffraction File Card No. 6-416 (ASTM, Philadelphia, PA, 1967).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.