Improving resistance to gate bias stress in pentacene TFTs with optimally cured polymer dielectric layers

Journal of the Electrochemical Society

Volumn 153, Issue 1, 2006, Pages

  Hwang, D K ^a   Park, Ji Hoon ^b   Lee, Jiyoul ^a   Choi, Jeong M ^a   Kim, Jae Hoon ^a   Kim, Eugene ^b   Im, Seongil ^a  

^a Yonsei University   (South Korea)

^b Hong Ik University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC INSULATORS; ELECTROCHEMISTRY; THERMAL EFFECTS; THIN FILM TRANSISTORS;

GATE BIAS STRESS; POLYMER DIELECTRIC LAYERS; PVP FILMS;

POLYMERS;

EID: 33645505144     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.2126585     Document Type: Article

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