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Volumn 20, Issue 11, 2005, Pages 2988-2996

Assessment of chemical solution synthesis and properties of Gd2Zr2O7 thin films as buffer layers for second-generation high-temperature superconductor wires

Author keywords

[No Author keywords available]

Indexed keywords

DECOMPOSITION; HIGH TEMPERATURE PROPERTIES; NICKEL; ORGANOMETALLICS; SOL-GELS; SOLUTIONS; SUBSTRATES; SUPERCONDUCTING MATERIALS; SYNTHESIS (CHEMICAL); TEXTURES; THIN FILMS; WIRE;

EID: 33645469147     PISSN: 08842914     EISSN: None     Source Type: Journal    
DOI: 10.1557/JMR.2005.0365     Document Type: Article
Times cited : (22)

References (24)
  • 4
    • 33645471566 scopus 로고    scopus 로고
    • A.P. Malozemoff: http://www.amsuper.com/html/products/library/ 2g_white_paper_-_march-2004.pdf
    • Malozemoff, A.P.1
  • 14
    • 0036600609 scopus 로고    scopus 로고
    • Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication
    • S. Sathyamurthy, B.W. Kang, T. Aytug, M. Paranthaman, P.M. Martin, A. Goyal, D.M. Kroeger, and D.K. Christen: Chemical solution deposition of lanthanum zirconate buffer layers on biaxially textured Ni-1.7% Fe-3% W alloy substrates for coated-conductor fabrication. J. Mater. Res. 17, 1543 (2002).
    • (2002) J. Mater. Res. , vol.17 , pp. 1543
    • Sathyamurthy, S.1    Kang, B.W.2    Aytug, T.3    Paranthaman, M.4    Martin, P.M.5    Goyal, A.6    Kroeger, D.M.7    Christen, D.K.8
  • 15
    • 2542428348 scopus 로고    scopus 로고
    • Development of long Y-123 coated conductors by ion-beam-assisted-deposition and the pulsed-laser-deposition method
    • Y. Iijima, K. Kakimoto, Y. Sutoh, S. Ajimura, and T. Saitoh: Development of long Y-123 coated conductors by ion-beam-assisted-deposition and the pulsed-laser-deposition method. Supercond. Sci. Technol. 17, S264 (2004).
    • (2004) Supercond. Sci. Technol. , vol.17
    • Iijima, Y.1    Kakimoto, K.2    Sutoh, Y.3    Ajimura, S.4    Saitoh, T.5
  • 18
    • 0026260838 scopus 로고
    • Impurity migration during SIMS depth profiling
    • J. Vriezema and P.C. Zalm: Impurity migration during SIMS depth profiling. Surf. Interf. Anal. 17, 875 (1991).
    • (1991) Surf. Interf. Anal. , vol.17 , pp. 875
    • Vriezema, J.1    Zalm, P.C.2
  • 19
    • 19244365612 scopus 로고    scopus 로고
    • Metalorganic deposition of YBCO films for second-generation high-temperature superconductor wires
    • M.W. Rupich, D.T. Verebelyi, W. Zhang, T. Kodenkandath, and X. Li: Metalorganic deposition of YBCO films for second-generation high-temperature superconductor wires. MRS Bull. 29(8), 572 (2004).
    • (2004) MRS Bull. , vol.29 , Issue.8 , pp. 572
    • Rupich, M.W.1    Verebelyi, D.T.2    Zhang, W.3    Kodenkandath, T.4    Li, X.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.