SCOPUS 정보 검색 플랫폼

Volumn 64, Issue 11, 1993, Pages 3294-3298

A method for the determination of the noise parameters in preamplifying systems for semiconductor radiation detectors

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33645405191 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.1144293 Document Type: Article

Times cited : (117)

References (14)

3
- 0027555161
- (1993) Nucl. Instrum. Methods A , vol.326 , pp. 85
- Brauninger, H.¹

8
- 84950547408
- presented at the, Villa Olmo, Como, Italy, June 22–26, (to be published in Nucl. Phys. B)
- (1992) 3rd International Conference on Advanced Technology and Particle Physics
- Cesura, G.¹ Re, V.² Tomasini, A.³

10
- 0003473124
- (Prentice-Hall, Englewood Cliffs, NJ)
- (1987) System Identification: Theory for the User , pp. 169
- Ljung, L.¹

11
- 84950547409
- If τ is expressed in seconds, [formula omitted] and [formula omitted] can differ by many orders of magnitude and the calculation algorithm might not converge. It is useful to express the shaping time in μs; the estimated parameters [formula omitted] and [formula omitted] should then be reconverted

13
- 84950547406
- High-quality test capacitors are to be used. Loss factors of the order of [formula omitted] are needed in order to minimize the related dielectric noises contribution

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