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Volumn 54, Issue 11, 2006, Pages 1973-1978
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Strain-compensated nano-clusters in Al-Si-Ge alloys
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Author keywords
Al Si Ge; Atom probe tomography; Clustering; HREM; Precipitation
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Indexed keywords
ALUMINUM;
NANOSTRUCTURED MATERIALS;
SOLID SOLUTIONS;
STRAIN;
TOMOGRAPHY;
TRANSMISSION ELECTRON MICROSCOPY;
ATOM PROBE TOMOGRAPHY;
ATOMIC MISMATCH;
STRAIN COMPENSATION;
ALUMINUM ALLOYS;
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EID: 33645327397
PISSN: 13596462
EISSN: None
Source Type: Journal
DOI: 10.1016/j.scriptamat.2006.01.046 Document Type: Article |
Times cited : (8)
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References (31)
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