Optical characterizations of ZnO, SnO2, and TiO2 thin films for butane detection

Applied Optics

Volumn 45, Issue 7, 2006, Pages 1425-1435

  Mazingue, Thomas ^a   Escoubas, Ludovic ^b   Spalluto, Lorenzo ^a,b,c,d,e,f   Flory, François ^b   Jacquouton, Patrick ^a   Perrone, Alessio ^c   Kaminska, Eliana ^d   Piotrowska, Anna ^d   Mihailescu, Ion ^e   Atanasov, Peter ^f  

^a Cybernetix SA   (France)

^b CNRS   (France)

^c INFN SEZIONE DI LECCE   (Italy)

^d Department of Micro and Nanotechnology of Wide Bandgap Semiconductors   (Poland)

^e NATIONAL INSTITUTE FOR LASER   (Romania)

^f INSTITUTE OF ELECTRONICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUTANE; CHEMICAL SENSORS; OZONE; TIN COMPOUNDS; ZINC OXIDE;

OPTOGEOMETRIC PROPERTIES; OZONE EXPOSURE; THE M-LINE TECHNIQUE;

THIN FILMS;

EID: 33645312078     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.001425     Document Type: Article

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