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Volumn 99, Issue , 2005, Pages 681-686
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Highly sensitive photorefractive interferometry using external ac-field
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Author keywords
[No Author keywords available]
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Indexed keywords
CARBON FIBERS;
ELECTRIC FIELD EFFECTS;
PHOTOREFRACTIVE MATERIALS;
RESPONSE TIME (COMPUTER SYSTEMS);
SEMICONDUCTING CADMIUM TELLURIDE;
ULTRASONIC DEVICES;
CARBON-FIBER COMPOSITES;
LASER ULTRASOUND DETECTOR;
PHOTOREFRACTIVE INTERFEROMETRY;
INTERFEROMETRY;
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EID: 33645229825
PISSN: 10945695
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (2)
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References (7)
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