Electron probe microanalysis (EPMA) investigations in the CeO 2-ThO2-ZrO2 system

Journal of Nuclear Materials

Volumn 350, Issue 2, 2006, Pages 169-172

  Grover, V ^a   Sengupta, P ^a   Bhanumurthy, K ^a   Tyagi, A K ^a  

^a BHABHA ATOMIC RESEARCH CENTRE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CERIUM COMPOUNDS; COMPOSITION; ELECTRON TRANSITIONS; ISOTHERMS; QUENCHING; TERNARY SYSTEMS; ZIRCONIA;

COMPOSITIONAL CHARACTERIZATION; ELECTRON PROBE MICROANALYSIS (EPMA); ISOTHERMAL CROSS-SECTION; ROOM TEMPERATURE;

MICROANALYSIS;

EID: 33645163850     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2006.01.001     Document Type: Article

References (6)

1. H. Kleykamp J. Nucl. Mater. 275 1999 1
2. V. Grover, and A.K. Tyagi J. Nucl. Mater. 305 2002 83
3. M.D. Mathews, B.R. Ambekar, and A.K. Tyagi J. Nucl. Mater. 288 2001 83
4. A.K. Tyagi, B.R. Ambekar, and M.D. Mathews J. Alloy Compd. 337 2002 275
5. J.L. Pouchou, F. Pichoir, Microbeam Analysis, San Francisco, California, 1985, p. 104.
6. P. Duwez, and F. Odell J. Am. Ceram. Soc. 33 1950 280