Advantages of coaxial external illumination for monitoring and control of laser materials processing

24th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2005 - Congress Proceedings

Volumn , Issue , 2005, Pages 915-919

  Regaard, Boris ^a   Kaierle, Stefan ^a   Schulz, Wolfgang ^a   Moalem, Anas ^b  

^a FRAUNHOFER INSTITUTE FOR LASER TECHNOLOGY   (Germany)

^b RWTH AACHEN UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CMOS INTEGRATED CIRCUITS; CONTROL SYSTEMS; ELECTROMAGNETIC WAVES; LASER BEAMS; LIGHTING; MATERIALS SCIENCE; PROCESS CONTROL; QUALITY ASSURANCE; SENSORS;

CMOS CAMERA; COAXIAL EXTERNAL ILLUMINATION; LASER MATERIALS PROCESSING; MATERIAL SURFACE;

SEMICONDUCTOR LASERS;

EID: 33645141995     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2351/1.5060481     Document Type: Conference Paper

References (6)

1. Wiesemann, W. (2004) Processmonitoring and closed-loop control, New Series Landolt-Börnstein, Group: Advanced Materials and Technologies, Volume VIII/1: Laser Physics and Applications, Subvolume C: Laser Applications, 2004, S. 243-272.
2. Müller, M.G., Dausinger, F., Hügel, H. (1998) Online process control of laser welding by measuring the reflected laser power, Proc. ICALEO'98, C122-131.
3. Griebsch, J., Schlichtermann, L., Jurca, M., Hoving, W., Nillesen, C. (1996) Quality assurance of industrial spot welding with a pulsed Nd:YAG laser, Proc. ICALEO'96, B164-173.
4. Kratsch, C. (2003) Realisierung eines kamerabasierten Prozessüberwachungs systems am Beispiel des Laserstrahlschweißens, Shakerverlag Aachen.
5. Beersiek, J. (2003) Überwachung und Regelung der Einschweißtiefe beim Schweißen mit Laserstrahlung, Shakerverlag Aachen.
6. Kaierle, S., Abels, P, Kratzsch, C. (2005) Process Monitoring and Control for Laser Materials Processing - An Overview, Proc. LIM 2005