Two improved runs rules for the Shewhart X̄ control chart

Quality Engineering

Volumn 18, Issue 2, 2006, Pages 173-178

  Khoo, Michael B C ^a   Ariffin, Khotrun Nada Bt ^a  

^a SCHOOL OF PHYSICS   (Malaysia)

Author keywords

Average run length (ARL); Lower control limit; Runs rules; Shewhart X control chart; Upper control limit

Indexed keywords

MANUFACTURING DATA PROCESSING; SENSITIVITY ANALYSIS; STATISTICAL METHODS; STATISTICAL PROCESS CONTROL;

AVERAGE RUN LENGTH; CONTROL CHART; LOWER CONTROL LIMIT; RUNS RULE; UPPER CONTROL LIMIT;

QUALITY CONTROL;

EID: 33645140625     PISSN: 08982112     EISSN: 15324222     Source Type: Journal    
DOI: 10.1080/08982110600567517     Document Type: Article

References (5)

1. Champ, C. W., Woodall, W. H. (1987). Exact results for Shewhart control charts with supplementary runs rules. Technometrics, 29:393-399 [CSA]
2. Hurwitz, A. M., Mathur, M. (1992). A very simple set of process control rules. Quality Engineering, 5:21-29 [CSA]
3. Klein, M. (2000). Two alternatives to the Shewhart X̄ control chart. Journal of Quality Technology, 32:427-431 [CSA]
4. Montgomery, D. C. (2001). Introduction to Statistical Quality Control, 4th ed. New York: John Wiley & Sons.
5. Nelson, L. S. (1984). The Shewhart control chart - tests for special causes. Journal of Quality Technology, 16:237-239 [CSA]