The influence of ZnNb 2O 6 on the microwave dielectric properties of ZrTi 2O 6 ceramics

Journal of the American Ceramic Society

Volumn 89, Issue 1, 2006, Pages 216-223

  RiaziKhoei, Parinaz ^a   Azough, Feridoon ^a   Freer, Robert ^a,b  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b AMERICAN CERAMIC SOCIETY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TEMPERATURE COEFFICIENT; WAVELENGTH DISPERSIVE SPECTROSCOPY (WDS);

NATURAL FREQUENCIES; OXYGEN; PERMITTIVITY; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE; ZIRCONIA;

CERAMIC MATERIALS;

EID: 33645113808     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2005.00705.x     Document Type: Conference Paper

References (24)

1. R. Freer, "Microwave Dielectric Ceramic - An Overview," Silicates Ind., 9-10, 191-7 (1993).
2. 2," J. Am. Ceram. Soc., 69 [11] 827-32 (1986).
3. 6," J. Solid State Chem., 64 [1] 30-46 (1986).
4. 24," J. Am. Ceram. Soc., 75 [3] 563-9 (1992).
5. 4 Microwave Dielectric Ceramics," J. Am. Ceram. Soc., 77 [6] 1441-50 (1994).
6. F. Azough, R. Freer, C. L. Wang, and G. W. Lorimer, "The Relationship Between the Microstructure and Microwave Dielectric Properties of Zirconium Titanate Ceramics," J. Mater. Sci., 31, 2539-49 (1996).
7. 24 Ceramics," J. Solid State Chem., 108 [2] 284-90 (1994).
8. 6, Compounds at Microwave Frequencies (A = Ca, Mg, Mn, Co, Ni, Zn, and B = Nb, Ta)," Jpn. J. Appl. Phys., 36 [10A] L1318-20 (1997).
9. 4 Microwave Dielectrics," J. Am. Ceram. Soc., 74 [6] 1320-4 (1991).
10. 2 Dielectric Resonators," J. Am. Ceram. Soc., 67 [4] 278-81 (1984).
11. 2 Ceramics," J. Mater. Sci., 27, 6303-10 (1992).
12. 4 Ceramics," J. Am. Ceram. Soc., 77 [12] 3215-20 (1994).
13. 6," J. Eur. Ceram. Soc., 23 [14] 2479-83 (2003).
14. K. Okuyama, Y. Yokotani, and K. Kugimiya. U.S. Patent 5356843, 1994.
15. 2," J. Mater. Res., 15 [6] 133-5 (2000).
16. M. I. Mendelson, "Average Grain Size in Polycrystalline Ceramics," J. Am. Ceram. Soc., 52 [8] 443-6 (1969).
17. H. M. Rietveld, "A Profile Refinement Method for Nuclear and Magnetic Structure." J. Appl. Cryst., 2, 65-71 (1969).
18. B. W. Hakki and P. D. Coleman, "A Dielectric Resonator Method of Measuring Inductive Capacitance in the Millimetre Range," IRE Trans. Microwave Theory Technol., 8, 402-10 (1960).
19. R. D. Shannon, "Revised Effective Ionic Radii and Systematic Studies of Interatomic Distances in Halides and Chalcogenides," Acta Crystallogr., Sect. A: Found Crystallogr., 32, 751-67 (1976).
20. A. Baumgarte and R. Blachnik, "Phase Relations in the System Titanium Dioxide-Diniobium-Zinc-Hexoxide," Mater, Res. Bull., 27 [11] 1287-94 (1992).
21. W. D. Kingery, H. K. Bowen, and D. R. Uhlmann, Introduction to Ceramics, 2nd edition, pp. 947-50. Wiley, New York, 1976.
22. A. Templeton, X. Wang, S. J. Penn, S. J. Webb, L. F. Cohen, and N. M. Alford, "Microwave Dielectric Loss of Titanium Oxide," J. Am. Ceram. Soc., 83 [1] 95-100 (2000).
23. 20-Based Ceramics-Resurrected for Modern Microwave Applications," Am. Carom. Soc. Bull., 72 [1] 80-9 (1993).
24. 4 System," J. Korean Ceram. Soc., 40 [4] 346-9 (2003).