Simulation of photothermal measurements on Cu-Carbon interface systems

Journal De Physique. IV : JP

Volumn 125, Issue , 2005, Pages 399-402

  Chotikaprakhan, S ^a,b   Dietzel, D ^a   Pelzl, J ^a   Neubauer, E ^c,d   Bein, B K ^a  

^a RUHR UNIVERSITY BOCHUM   (Germany)

^b KASETSART UNIVERSITY   (Thailand)

^c ARC SEIBERSDORF RESEARCH GMBH   (Austria)

^d VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CARBON; COMPUTER SIMULATION; COPPER ALLOYS; INTERFACES (MATERIALS); MATHEMATICAL MODELS; SUBSTRATES;

2-LAYER MODEL APPROXIMATIONS; CU-CARBON INTERFACE SYSTEMS; PHOTOTHERMAL MEASUREMENTS; THERMAL CONTACT RESISTANCE;

THERMAL VARIABLES MEASUREMENT;

EID: 33645085345     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2005125093     Document Type: Conference Paper

References (6)

1. E. Neubauer, G. Korb, C. Eisenmenger-Sittner, H. Bangert, S. Chotikaprakhan, D.Dietzel, A.M. Mansanares, B.K. Bein, Thin Solid Films 433, 2003, 160-165.
2. M. Reichling and H. Gronbeck, J. Appl. Phys. 75, 1914 (1994).
3. S. Chotikaprakhan, D. Dietzel, E. Neubauer, B.K. Bein, J. Pelzl, Identification of efficient deposition conditions based on the determination of the effective thermal transport properties of Cu-C interface systems, In: Conference Proceedings 13 ICPPP, Rio de Janeiro, Brazil.
4. th Internat. Colloq. on Plasma Processes (ed. sfv, Paris, France, 2001), 335-337.
5. J.L. Nzodoum Fotsing, J. Gibkes, J. Pelzl, B.K. Bein, Inverse solution of the thermal wave problem for two-layer systems, to be publ. in JAP, 2005.
6. D. Dietzel, S. Chotikaprakhan, E. Neubauer, B.K. Bein, J. Pelzl, Thermo-reflectance microscopy of thermal properties and contact resistances of sputter-deposited Cu films on carbon, to be publ. in 2005.