Backscattering enhancement of light by nanoparticles positioned in localized optical intensity peaks

Applied Optics

Volumn 45, Issue 4, 2006, Pages 633-638

  Chen, Zhigang ^a   Li, Xu ^a   Taflove, Allen ^a   Backman, Vadim ^a  

^a Northwestern University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; LIGHTING; NANOSTRUCTURED MATERIALS; PHOTODETECTORS; RAYLEIGH SCATTERING; SCANNING;

DIELECTRIC MICROCYLINDERS; NEAR FIELD PROBES; OPTICAL INTENSITY PEAKS; VISIBLE LIGHT;

BACKSCATTERING;

NANOMATERIAL;

ARTICLE; CHEMISTRY; LIGHT; METHODOLOGY; PHOTOMETRY; RADIATION SCATTERING; REFRACTOMETRY;

LIGHT; NANOSTRUCTURES; NEPHELOMETRY AND TURBIDIMETRY; REFRACTOMETRY; SCATTERING, RADIATION;

EID: 33645022843     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.000633     Document Type: Article

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