Head disk interface technologies for high recording density and reliability

Fujitsu Scientific and Technical Journal

Volumn 42, Issue 1, 2006, Pages 113-121

  Goto, Yasuyuki ^a,b,c,d   Nakamura, Norikazu ^b   Mizutani, Akiyo ^a,e   Chiba, Hiroshi ^a,f   Watanabe, Keiji ^a,d,g  

^a FUJITSU LABORATORIES LTD   (Japan)

^b Transmission Electron Microscopy ^*  (Japan)

^c Magnetics Society of   (Japan)

^d JAPAN SOCIETY OF APPLIED PHYSICS   (Japan)

^e Japan Society for Analytical Chemistry   (Japan)

^f Japanese Society of Tribologists   (Japan)

^g Society of Silicon Chemistry Japan   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL TREATMENT; DROP METHOD; HEAD DISK INTERFACE TECHNOLOGIES;

HARD DISK STORAGE; INTERFACES (MATERIALS); LUBRICANTS; MAGNETIC STORAGE; SCATTERING; SPECTROSCOPIC ANALYSIS;

RECORDING INSTRUMENTS;

EID: 33644993671     PISSN: 00162523     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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