Detecting fingerprint minutiae by run length encoding scheme

Pattern Recognition

Volumn 39, Issue 6, 2006, Pages 1140-1154

  Shin, Jung Hwan ^a   Hwang, Hui Yeoun ^b   Chien, Sung Il ^a,c,d,e  

^a Kyungpook National University   (South Korea)

^b SAMSUNG Electronics   (South Korea)

^c IEE ^*

^d IEE   (South Korea)

^e Society for Information Display   (South Korea)

Author keywords

Feature extraction; Fingerprint; Minutiae; Minutiae extraction; Run length encoding

Indexed keywords

ALGORITHMS; BIFURCATION (MATHEMATICS); FEATURE EXTRACTION; IMAGE CODING; PATTERN MATCHING;

FINGERPRINT; MINUTIAE; MINUTIAE EXTRACTION; RUN LENGTH ENCODING;

PATTERN RECOGNITION;

EID: 33644978467     PISSN: 00313203     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.patcog.2005.12.013     Document Type: Article

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