Thermal activation, cathodo- and photoluminescence measurements of rare earth doped (Tm, Tb, Dy, Eu, Sm, Yb) amorphous/nanocrystalline AlN thin films prepared by reactive rf-sputtering

Optical Materials

Volumn 28, Issue 6-7, 2006, Pages 790-793

  Weingartner R ^a,b   Erlenbach, O ^a,b   Winnacker, A ^a   Welte, A ^a   Brauer, I ^a   Mendel, H ^a   Strunk, H P ^a   Ribeiro, C T M ^c   Zanatta, A R ^c  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b PONTIFICIA UNIVERSIDAD CATÓLICA DEL PERÚ   (Peru)

^c UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Aluminium nitride; Amorphous; Annealing; Luminescence; Microstructure; Nanocrystalline; Rare earths

Indexed keywords

CRYSTALLINE MATERIALS; NANOSTRUCTURED MATERIALS; PHOTOLUMINESCENCE; RARE EARTHS; THERMAL EFFECTS;

ALUMINIUM NITRIDE; AMORPHOUS; NANOCRYSTALLINE;

THIN FILMS;

EID: 33644975105     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2005.09.024     Document Type: Conference Paper

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