|
Volumn 39, Issue 13, 2006, Pages 3221-3230
|
Critical regime of two-dimensional Ando model: Relation between critical conductance and fractal dimension of electronic eigenstates
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 33644962349
PISSN: 03054470
EISSN: 13616447
Source Type: Journal
DOI: 10.1088/0305-4470/39/13/003 Document Type: Article |
Times cited : (53)
|
References (37)
|