Design of optical tracking for scanned-cantilever atomic force microscope

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 33, Issue 1, 2006, Pages 26-30

  Yang, Jin Tao ^a   Xu, Wen Dong ^a  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

Author keywords

Atomic force microscope; Instrumentation; Optical tracking; Scanned cantilever

Indexed keywords

LIGHT REFLECTION; OPTICAL DESIGN; OPTICAL SYSTEMS; PERFORMANCE; SCANNING; TRACKING (POSITION);

ATOMIC FORCE MICROSCOPE; INSTRUMENTATION; OPTICAL TRACKING; SCANNED-CANTILEVER;

ATOMIC FORCE MICROSCOPY;

EID: 33644957326     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

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