Recursive integration methodologies with statistical applications

Journal of Statistical Planning and Inference

Volumn 136, Issue 7 SPEC. ISS., 2006, Pages 2284-2296

  Hayter, A J ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

Computational intensity; Critical point calculation; Markov property; Multiple comparisons; Numerical integration; Recursive integration; Sequential analysis; Tree structure

Indexed keywords

EID: 33644931895     PISSN: 03783758     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jspi.2005.08.024     Document Type: Article

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