|
Volumn 73, Issue 5, 2006, Pages 765-771
|
Electrical transport in deformed nanostrips: Electrical signature of reversible mechanical failure
|
Author keywords
[No Author keywords available]
|
Indexed keywords
|
EID: 33644923791
PISSN: 02955075
EISSN: 12864854
Source Type: Journal
DOI: 10.1209/epl/i2005-10448-8 Document Type: Review |
Times cited : (4)
|
References (20)
|