Fabrication and characterisation of CuInSe2/Si(1 0 0) thin films by the stacked elemental layer (SEL) technique

Catalysis Today

Volumn 113, Issue 3-4, 2006, Pages 226-229

  Bechiri, L ^a   Benabdeslem, M ^a   Benslim, N ^a   Djekoun, A ^a   Otmani, A ^a   Mahdjoubi, L ^a   Madelon, R ^b   Ruterana, P ^c   Nouet, G ^c  

^a BADJI MOKHTAR UNIVERSITY   (Algeria)

^b LERMAT Laboratoire d'Etude et de Recherche sur les Materiaux   (France)

^c LABORATOIRE CRISMAT   (France)

Author keywords

Chalcopyrite; CuInSe2; Defects; SEL

Indexed keywords

COMPOSITION; COPPER COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; EVAPORATION; PHOTOLUMINESCENCE; SILICON WAFERS;

CHALCOPYRITE; CUINSE2; SEL;

THIN FILMS;

EID: 33644886306     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cattod.2005.11.071     Document Type: Article

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