Resolving dd transitions in NaV2 O5 using angle-resolved resonant inelastic x-ray scattering at the V L edge

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 12, 2006, Pages

  Zhang, G P ^a   Callcott, T A ^b  

^a INDIANA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF TENNESSEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33644862439     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.125102     Document Type: Article

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