Correlation of highly charged ion and X-ray emissions from the laser-produced plasma in the presence of non-linear phenomena

Radiation Effects and Defects in Solids

Volumn 160, Issue 10-12, 2005, Pages 557-566

  Laska L ^a   Ryc L ^b   Badziak, J ^b   Boody, F P ^c   Gammino, S ^d   Jungwirth, K ^e   Krasa J ^a   Krousky E ^a   Mezzasalma, A ^e   Parys, P ^b   Pfeifer, M ^a   Rohlena, K ^a   Torrisi, L ^e   Ullschmied, J ^a   Wolowski J ^b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b SOLTAN INSTITUTE FOR NUCLEAR STUDIES   (Poland)

^c Ion Light Technologies GmbH   (Germany)

^d INFN SEZIONE DI CATANIA   (Italy)

^e UNIVERSITY OF MESSINA   (Italy)

Author keywords

Highly charged ions; Soft and hard X rays; Laser beam interactions; Non linear processes; Self focusing

Indexed keywords

CORRELATION METHODS; IONS; LASERS; NONLINEAR SYSTEMS; PLASMAS; TANTALUM;

HIGHLY CHARGED IONS; SOFT AND HARD X-RAYS; LASER BEAM INTERACTIONS; NON-LINEAR PROCESSES; SELF-FOCUSING;

X RAY OPTICS;

EID: 33644799980     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150500492669     Document Type: Conference Paper

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