|
Volumn 56, Issue 3, 2006, Pages 192-199
|
Quantitative WDS analysis using electron probe microanalyzer
|
Author keywords
EPMA; Quantitative analysis; Thermal barrier coating; Wavelength dispersive X ray spectroscopy
|
Indexed keywords
SINGLE CRYSTALS;
SPECTROSCOPIC ANALYSIS;
SUPERALLOYS;
THERMAL BARRIER COATINGS;
EPMA;
THERMAL BARRIER COATING;
WAVELENGTH DISPERSIVE X-RAY SPECTROSCOPY;
ELECTRONS;
|
EID: 33644779569
PISSN: 10445803
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchar.2005.11.007 Document Type: Article |
Times cited : (15)
|
References (7)
|