Digital holographic microscope with a wide field of view

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6016, Issue , 2005, Pages

  Shin, Sanghoon ^a   Park, Minchul ^a   Han, Il Ki ^a   Son, Jung Young ^b  

^a Korea Institute of Science and Technology   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANGLE MEASUREMENT; CHARGE COUPLED DEVICES; DIFFRACTION; DISTANCE MEASUREMENT; HOLOGRAPHY; IMAGE RECONSTRUCTION; MICROSCOPES; OPTICAL RESOLVING POWER;

DIGITAL HOLOGRAPHIC MICROSCOPE; FRESNEL APPROXIMATION; MAGNIFICATION; MAGNIFIED IMAGE; OBJECTIVE LENS; PIXEL SIZE; REFERENCE BEAM;

IMAGING TECHNIQUES;

EID: 33644768951     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.630262     Document Type: Conference Paper

References (11)

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